Delkin Devices SLC 1 GB USB USB Flash Drive, U40GTQHFL-XN000-D
- RS庫存編號:
- 763-233
- 製造零件編號:
- U40GTQHFL-XN000-D
- 製造商:
- Delkin Devices
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- RS庫存編號:
- 763-233
- 製造零件編號:
- U40GTQHFL-XN000-D
- 製造商:
- Delkin Devices
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選取全部 | 屬性 | 值 |
|---|---|---|
| 品牌 | Delkin Devices | |
| Product Type | USB Flash Drive | |
| Memory Size | 1GB | |
| Interface Type | USB | |
| Mount Type | Plug-in | |
| Cell Type | SLC | |
| Maximum Supply Voltage | 5V | |
| Minimum Supply Voltage | 5V | |
| Minimum Operating Temperature | -40°C | |
| Maximum Operating Temperature | 85°C | |
| Width | 17mm | |
| Standards/Approvals | RoHS Compliant | |
| Height | 8mm | |
| Length | 67.7mm | |
| Automotive Standard | No | |
| Series | B300 Series | |
| 選取全部 | ||
|---|---|---|
品牌 Delkin Devices | ||
Product Type USB Flash Drive | ||
Memory Size 1GB | ||
Interface Type USB | ||
Mount Type Plug-in | ||
Cell Type SLC | ||
Maximum Supply Voltage 5V | ||
Minimum Supply Voltage 5V | ||
Minimum Operating Temperature -40°C | ||
Maximum Operating Temperature 85°C | ||
Width 17mm | ||
Standards/Approvals RoHS Compliant | ||
Height 8mm | ||
Length 67.7mm | ||
Automotive Standard No | ||
Series B300 Series | ||
- COO (Country of Origin):
- US
The Delkin Devices Industrial USB Drive is engineered for the secure transfer and storage of critical data in demanding environments. Featuring industrial-grade SLC NAND flash, the device ensures reliability and durability across various applications. It is compliant with USB 3.1 specifications while maintaining backward compatibility with USB 2.0 and 1.1. This USB drive is designed to excel in a range of temperature conditions, ensuring consistent performance. With Advanced features such as data protection technology and enhanced data integrity mechanisms, it provides an optimal solution for industrial users requiring dependable storage solutions.
Capacity options range from 1GB to 32GB, tailored for different storage needs
Operates in extreme temperatures from -40°C to +85°C, suitable for harsh environments
Supports a high Mean Time Between Failures (MTBF) of over 2 million hours, ensuring long-lasting reliability
Equipped with Error Correction Code (ECC) technology for data integrity during read processes
Incorporates wear leveling algorithms to maximise NAND flash lifespan and performance
Advanced bad Block management system detects and handles defective memory Blocks effectively
Utilises dynamic data refresh for extended data retention over the lifecycle of the drive
SMART functionality allows the drive to self-monitor and report health status
Page-based mapping enhances random performance and reduces write amplification
Fully compliant with RoHS and USB 3.1 standards, ensuring environmental and performance compliance
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